Scanning Transmission Electron Microscopy

© MCF

Scanning Transmission Electron Microscopy

Our core facility offers high-resolution STEM (Scanning Transmission Electron Microscopy) imaging for detailed 2D analysis of thin specimens. In STEM mode, a finely focused electron beam is scanned across the sample, producing clear and high-contrast images of ultrastructural features. This technique is well-suited for examining fine details within biological and material samples. Additionally, we offer the possibility of mosaic scans to capture larger areas while maintaining high resolution.

If you are interested, please contact us.

© MCF

Microscopy Core Facility

Instruments / Service

Getting started

Contact / Sample submission

1/7 Chamber view with TEM grid sample holder and STEM detector. © MCF

2/7 Brain imaged with STEM detector. © MCF

3/7 Side port view with TEM grid sample holder. © MCF

4/7 Heart tissue imaged with STEM detector. © MCF

5/7 TEM grid sample holder for STEM imaging. © MCF

6/7 Liver tissue imaged with STEM detector. © MCF

7/7 Zeiss Crossbeam 550 equipped with STEM detector. © MCF

The Core Facilities thank the German Research Foundation for continuous support.

Durchführung einer Laparoaskopie

© DFG

Dekanat der medizinischen Fakultät

Dekanatskommission Core Facilities

Koordinationsbüro wissenschaftliche Infrastruktur

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