Zeiss Crossbeam 550
High-resolution FIB-SEM system for 2D and 3D imaging of biological and material samples. Equipped with SE, BSE, EsB, Inlens, and STEM detectors, it enables flexible contrast modes for surface, compositional, ultrastructural, and transmission imaging. The integrated Capella FIB column allows for precise milling and volume imaging at nanometer resolution. Ideal for volume electron microscopy, transmission analysis of thin samples, and correlative workflows.
Funding information:
Deutsche Forschungsgemeinschaft (DFG, German Research Foundation) – Projektnummer 388171357 (see further information for acknowledgment)
Detectors:
Retractable STEM (transmitted electrons)
SE2/ETD (secondary electrons)
Inlens SE (secondary electrons)
Retractable BSD (backscattered electrons)
Inlens EsB (energy selective backscattered electrons)
Electron column:
Zeiss Gemini 2: Field-emission, Schottky Emitter, double condensor, 1-30 kV, 10 pA - 100 nA
Ion column:
Zeiss Capella FIB: Gallium source, 1-30 kV, 1 pA - 100 nA
Gas injection system:
Platinum GIS
Carbon GIS
Stage:
Six axis motorized stage
Sample holder:
Carousel holder for stubs
TEM grid holder (for up to 12 TEM grids)
Correlative coverslip holder
Software:
SmartSEM, SmartFIB
ATLAS (Engine) 5
The Core Facilities thank the German Research Foundation for continuous support.
